Is it possible to create a feature that allows the user to select an area within an image in the fitsviewer to give a targeted opportunity to critique background psuedo ADU e.g a moveable box of say 100x100 pixels that shows the user some appropriate stats. The mean/min/max of the 10,000 'background'pixels could be a useful value to quickly determine exposure. The Fitsviewer currently produces DN values for the whole image so why not for a user selected area. Maybe link said feature with the cursor over the image.
Skywatcher 190MN - EQ6 Pro (with Belt Mod) - ASI1600MM-Cooled - ASI EFW7 - ASI120MM - WO f4 Guide Scope - Rigel nStep - KStars/Ekos - KDE - PixInsight
I agree absolutely with this request. In order to determine the right exposure, we have to compare the standard deviation of the background into a capture to the same value into an offset. The capture value must be within 3.5 and 5 the offset value. So we have to select an area of the image background. Today I have to load the two images into Iris software to do that. It would be convenient to be able to do so with Kstars.
I assume with 'offset' you refer to a dark? Indeed an interesting way of doing it. It seems to boil down to the standard approach of 'swamping read noise', using the dark/offset STDEV as read noise?